发信人: lingtingsnow (lingling), 信区: Engineering
标  题: 麻烦求一篇文章，谢谢
发信站: BBS 未名空间站 (Sat Oct 17 03:53:40 2020, 美东)

Journal of Microscopy, 2014 Sep;255(3):180-7.

Use of permanent marker to deposit a protection layer against FIB damage in
TEM specimen preparation

Y C Park 1 , B C Park, S Romankov, K J Park, J H Yoo, Y B Lee, J-M Yang 

DOI:   10.1111/jmi.12150  


e-mail: hq_li72@yahoo.com
--
※ 来源:·WWW 未名空间站 网址：mitbbs.com 移动：在应用商店搜索未名空间·[FROM: 137.]